Web我司作为德国ion-tof公司的中国总代理,成立于2012年。主要负责中国大陆及港澳地区的销售、售后、宣传、技术培训等工作。公司成员来自北京大学、中科院物理所等一流院校 … WebTime-of-Flight Secondary Ion Mass Spectrometry Summary Time-of-flight secondary ion mass spectrometry (ToF-SIMS) employs a pulsed primary ion beam and a time-of-flight mass analyzer for the detection of molecular ions with mass-to-charge ratios ranging from m/z 1 to m/z 10,000 in a single spectrum.
公司简介_北京艾飞拓科技有限公司(IONTOF中国代表处)
Web25 mei 2024 · IONTOF GmbH 626 followers on LinkedIn. Advanced Ion Beam Technology for Surface Analysis. Innovative Ion Beam Technology for Surface Analysis IONTOF is a manufacturer of innovative instruments ... Web• TOF-SIMS: “ION-TOF IV” instrument. Ga-LMIS analytical source, 25 keV, high current bunched mode (typically m/∆m = 8000), analysis area 60×60 µm2. Sputter source Ar-EI, 3 keV, sputter area 200×200 µm2. Pulsed electron source for neutralisa-tion, 4×10–6 mbar argon flooding for sensitivity enhancement. e36 rear seat harness sedan
Time-of-Flight Secondary Ion Mass Spectrometry NIST
Web19 jan. 2024 · Specifically with a huge cluster ion beam such as Ar cluster ions, TOF-SIMS provides organic depth profiles in detail, which is powerful not only for organic and polymer science fields but also for biological fields. However, secondary ionization by TOF-SIMS is often a problem in quantitative analysis due to the matrix effects 1–14 1. R. G. Web26 dec. 2009 · 本文简要叙述法国cameca 公司,德国ion tof gmbh 公司新型的nano sims50ims wf ims sc uitra tof sims iv 型二次离子质谱的特色,着重介绍这些仪器改进过的和新增加的 … Web3 jul. 2012 · 艾飞拓公司简介. 北京艾飞拓科技有限公司作为德国ION-TOF公司的中国总代理,成立于2012年。. 公司成员来自北京大学、中科院物理所等一流院校研究生。. 主要负 … csgo analyst desk